Nondestructive concentration depth profiling by XPS.
Nondestructive determination of the surface concentration gradients at solid surfaces modified by ion and laser beams using angle resolved photoelectron spectroscopy and lineshape analysis, scattering of electrons in solids.
RNDr. BASTL ZdenÄ›k, CSc.
Department: Department of Low-dimensional Systems
Phone: (+420) 26605 3526, 3466, 3456
Fax: (+420) 266053910
Room: 234, 207, 204